Optimization of instrument matrix for Mueller matrix ellipsometry based on partial elements analysis of the Mueller matrix
نویسندگان
چکیده
منابع مشابه
ellipsometry and Mueller matrix polarimetry
We characterized two samples consisting of photoresist layers on silicon with square arrays of square holes by spectroscopic ellipsometry (SE) and Mueller matrix polarimetry (MMP). Hole lateral dimensions and depths were determined by fitting either SE data taken in conventional planar geometry or MMP data in general conical diffraction configurations. A method for objective determination of th...
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Materials can be tailored on the nano-scale to show properties that cannot be found in bulk materials. Often these properties reveal themselves when electromagnetic radiation, e.g. light, interacts with the material. Numerous examples of such types of materials are found in nature. There are for example many insects and birds with exoskeletons or feathers that reflect light in special ways. Of ...
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We present a Mueller matrix decomposition based on the differential formulation of the Mueller calculus. The differential Mueller matrix is obtained from the macroscopic matrix through an eigenanalysis. It is subsequently resolved into the complete set of 16 differential matrices that correspond to the basic types of optical behavior for depolarizing anisotropic media. The method is successfull...
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Measurement of the light-scattering Mueller matrix of phytoplankton cultures resulted in a characteristic Mueller matrix much like that of seawater. Voss and Fry (1984) measured the scattering of polarized light by ocean water. We here report measurements of various phytoplankton cultures made to further our understanding of the ocean water measurements. To quantify changes in polarization due ...
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The University of Arizona Polarization Laboratory with support from the Jet Propulsion Laboratory (JPL) has assembled and is currently calibrating a UV Mueller matrix imaging polarmeter (UV-MMIP). The desire for more accurate polarimetric and radiometric sensors drives the need for stringent polarization requirements and the ability to more precisely measure system and component polarization be...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2017
ISSN: 1094-4087
DOI: 10.1364/oe.25.018872